CHOURASIA, A. R.; PEARSON, Justin Seth. Investigation of Diffusion at the Cu/Hf Interface by X-ray Photoelectron Spectroscopy. Quarterly Physics Review, [S.l.], v. 4, n. 2, apr. 2018. ISSN 2572-701X. Available at: <https://esmed.org/MRA/qpr/article/view/1717>. Date accessed: 22 dec. 2024. doi: https://doi.org/10.18103/qpr.v4i2.1717.